In modern scanning electron microscopy, sample surface preparation is of key importance. This book presents the procedures for sample surface preparation, thereby facilitating unprecedented capabilities with advanced scanning electron microscopes.
In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.
Schlagwörter zu:
New Horizons of Applied Scanning Electron Microscopy von Kenichi Shimizu - mit der ISBN: 9783642031601
High-resolution SEM; Metals and their structures; SEM sample preparation; Sample surface preparation; Scanning electron microscopy; alloy; electron microscopy; microscopy; scanning electron microscope; transmission electron microscopy; C; Spectroscopy; Condensed Matter Physics; Nanotechnology; Surfaces, Interfaces and Thin Film; Measurement Science and Instrumentation; Microsystems and MEMS; Chemistry and Materials Science, Online-Buchhandlung
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